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The 27th AIRAPT International Conference on High Pressure Science and Technology
Abstract

Poster


16:30

Rietveld Refinement and pairs distribution function analysis to study the pressure dependence of the nanostructured SnSe2

Authors:
Zeane V.borges (UFSC - Universidade Federal de Santa Catarina) ; Claudio M.poffo (UFSC - Universidade Federal de Santa Catarina) ; Querem H.f. Rebelo (UFOPA - Universidade Federal do Oeste do Pará , UFAM - Universidade Federal do Amazonas) ; João C. de Lima (UFSC - Universidade Federal de Santa Catarina)

Abstract:

The effect of high-pressures over structural properties of trigonal nanostructured SnSe2 produced by Mechanical Alloying (MA) was investigated by in situ angle-dispersive X-ray diffraction (ADXRD) up to 25.8 GPa. The effect of pressure on lattice parameters, z coordinate and unit cell volume were investigated from Rietveld Method [1]. These data were used to calculate the partial [Gij(R)] and total [G(R)] pairs distribution functions. The PDF analysis offered the possibility of following the effect of high pressure in these functions to determine which atomic pairs are most affected [2]. The behaviors seen in these functions were associated to changes observed in the macroscopic physical properties reported at literature for SnSe2.

 

ACKNOWLEDGEMENTS:

The authors acknowledge the Brazilian founding agency CAPES by the financial support. 

 

REFERENCES:

[1] H. M. Rietveld, J. Appl. Crystallogr. 2, 65 (1969).

[2] J. C. de Lima, Z. V. Borges, C. M. Poffo, S. M. Souza, D. M. Trichês, and R. S. de Biasi, e-print arXiv:1803.05430.